Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

PREFACE IX I. Noise Sources 1/f Noise Sources 3 F.N. Hooge Noise Sources in GaN/AlGaN Quantum Wells and Devices 11 S. Rumyantsev 1/f Noise in Nanomaterials and Nanostructures: Old Questions in a New Fashion 19 M. N. Mihaila 1/f Spectra as a Consequence of the Randomness of Variance 29 G. Hartler Quantum Phase Locking, 1/f Noise and Entanglement 37 M. Planat and H.Rosu Shot Noise in Mesoscopic Devices and Quantum Dot Networks 45 M. Macucci, P. Marconcini, G. Iannaccone, M. Gattobigio, G. Basso and B. Pellegrini Super-Poissonian Noise in Nanostructures 53 Ya. M. Blanter Stochastic and Deterministic Models of Noise 61 J. Kumi..ak II. Noise in Nanoscale Devices Noise in Optoelectronic Devices 71 R. Alabedra Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers 79Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels 89 A. Matulionis Noise of High Temperature Superconducting Bolometers 97 I.A. Khrebtov 1/f Noise in MOSTs: Faster is Noisier 109 L.K.J. Vandamme Experimental Assessment of Quantum Effects in the Low- Frequency Noise and RTS of Deep Submicron MOSFETs 121 E. Simoen, A. Mercha and C. Claeys Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs 129 N. Lukyanchikova, E. Simoen, A. Mercha and C. Claeys Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors 137 S. Ferraton, L. Montès, I. Ionica, J. Zimmermann, and J. A. Chroboczek Noise Modelling in Low Dimensional Electronic Structures 145 L. Reggiani, V. Ya. Aleshkin and A. Reklaitis Correlation Noise Measurements and Modeling of Nanoscale MOSFETs 153 J. Lee and G. Bosman Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs 161 M. Levinshtein, S. Rumyantsev and M. S. Shur High Frequency Noise Sources Extraction in Nanometique MOSFETs 169 F. Danneville, G. Pailloncy and G. Dambrine Informative “Passport Data” of Surface Nano- and Microstructures 177 S. F. Timashev, A. B. Solovieva and G. V. Vstovsky VII III. Noise Measurement Technique Noise Measurement Techniques 189 L.K.J. Vandamme Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures 203 B.Pellegrini, G. Basso and M. Macucci Correlation Spectrum Analyzer: Principles and Limits in Noise Measurements 211 G. Ferrari and M. Sampietro Measurement and Analysis Methods for Random Telegraph Signals 219 Z. اelik-Butler RTS In Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation 227 J. Sikula, J. Pavelka, M. Tacano, S. Hashiguchi and M. Toita Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region 237 J. Sikula, S. Hashiguchi, M. Ohki and M. Tacano Measurements of Low Frequency Noise in Nano-Grained RuO2+Glass Films Below 1 K 245 A. Kolek Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices 253 A. Yakimov, A. Belyakov, S. Medvedev, A. Moryashin and M. Perov The Noise Background Suppression of Noise Measuring Set-Up 261 P. Hruska and K. Hajek Accuracy of Noise Measurements for 1/f and GR Noise 271 I. Slaidi..ڑ Radiofrequency and Microwave Noise Metrology 279 E. Rubiola and V. Giordano VIII Treatment of Noise Data in Laplace Plane 287 B. M. Grafov Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation 293 L. Hasse Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices 303 L. Spiralski, A. Szewczyk and L. Hasse Hooge Mobility Fluctuations in n-InSb Magnetoresistors as a Reference for Access Resistance LF-Noise Measurements of SiGe Metamorphic HMOS FETs 311 S. Durov, O.A. Mironov, M. Myronov, T.E. Whall, V.T. Igumenov, V.M. Konstantinov and V.V. Paramonov Optimised Preamplifier for LF-Noise MOSFET Characterization 319 S. Durov and O.A. Mironov Net of YBCO and LSMO Thermometers for Bolometric Applications 327 B. Guillet, L Méchin, F. Yang, J.M. Routoure, G. Le Dem, C. Gunther, D. Robbes and R.A. Chakalov Diagnostics of GaAs Light Emitting Diode pn Junctions 337 P. Koktavy and B. Koktavy New Tools for Fast and Sensitive Noise Measurements 345 J. Sikula, M. Tacano, S. Yokokura and S. Hashiguchi Using a Novel, Computer Controlled Automatic System for LF Noise Measurements under Point Probes 355 J.A. Chroboczek, S. Ferraton and G. Piantino AUTHOR INDEX 363 SUBJECT INDEX 365