فناوری نانو الکتروشیمیایی : در محل تکنیک پروب محلی در الکتروشیمیایی رابط Electrochemical Nanotechnology: In-situ Local Probe Techniques at Electrochemical Interfaces

A new window to local studies of interface phenomena at solid state surfaces has been opened by the development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years. The in-situ application of local probe methods in different systems belongs to modern nanotechnology and has two aspects: an analytical aspect and a preparative aspect. The first aspect covers the application of the local probe methods to characterize thermodynamic, structural and dynamic properties of solid state surfaces and interfaces and to investigate local surface reactions. Two methods which are still in the beginning of their development represent the second aspect: tip and cantilever. They can be used to form defined nano-objects such as molecular or atomic clusters, quantum dots etc. as well as to structure or modify solid state surfaces in the nanometer range. This IUPAC monograph is a comprehensive treatment of both aspects and presents the current state of knowledge. It is written for scientists active in the area of nanotechnology. Content: Chapter 1 Local Probing of Electrochemical Processes at Non?ideal Electrodes (pages 1–12): E. Ammann, P. I. Oden and H. SiegenthalerChapter 2 Electrochemistry and Nanotechnology (pages 13–25): G. Staikov and W. J. LorenzChapter 3 Imaging of Electrochemical Processes and Biological Macromolecular Adsorbates by in?situ Scanning Tunneling Microscopy (pages 27–44): Jens E. T. Andersen, Jens Ulstrup and Per MollerChapter 4 Beyond the Landscapes: Imaging the Invisible (pages 45–55): A. A. Kornyshev and M. SumetskiiChapter 5 Roughness Kinetics and Mechanism Derived from the Analysis of AFM and STM Imaging Data (pages 56–71): R. C. Salvarezza and A. J. ArviaChapter 6 Electrodes with a defined mesoscopic structure (pages 73–86): U. Stimming and R. VogelChapter 7 In?situ Stress Measurements at the Solid/Liquid Interface Using a Micromechanical Sensor (pages 87–99): T. A. Brunt, E. D. Chabala, T. Rayment, S. J. O'Shea and M. E. WellandChapter 8 Surface structure and electrochemistry: new insight by scanning tunneling microscopy (pages 101–112): Giovanni Aloisi, Massimiliano Cavallini and Rolando GuidelliChapter 9 STM and AFM Studies of the Electrified Solid?Liquid Interface: Monolayers, Multilayers, and Organic Transformations (pages 112–124): Andrew A. Gewirth and Brian K. NieceChapter 10 Scanning Probe Microscopy Studies of Molecular Redox Films (pages 125–136): James E. Hudson and Hector D. AbrunaChapter 11 New Aspects of Iodine?modified Single?crystal Electrodes (pages 137–148): Kingo ItayaChapter 12 The growth and the surface properties of polypyrrole on single crystal graphite electrodes as studied by in?situ electrochemical scanning probe microscopy (pages 149–157): Chr. Froeck, A. Bartl and L. DunschChapter 13 Nucleation and growth at metal electrode surfaces (pages 158–170): O. M. Magnussen, F. Moller, M. R. Vogt and R. J. BehmChapter 14 STM Study of Electrodeposition of Strained?Layer Metallic Superlattices (pages 171–184): T. P. MoffatChapter 15 STM Studies of Thin Anodic Oxide Layers (pages 184–197): Philippe Marcus and Vincent MauriceChapter 16 Local Probing of Electrochemical Interfaces in Corrosion Research (pages 199–213): A. Schreyer, T. Suter, L. Eng and H. BohniChapter 17 Morphology and Nucleation of Ni?TiO2 LIGA layers (pages 215–224): M. Strobel, U. Schmidt, K. Bade and J. HalbritterChapter 18 SPM Investigations on Oxide?covered Titanium Surfaces: Problems and Possibilities (pages 225–239): C. Kobusch and J. W. SchultzeChapter 19 Electrochemical surface processing of semiconductors at the atomic level (pages 240–252): P. Allongue and C. Henry de VilleneuveChapter 20 In?situ Electrochemical AFM Study of Semiconductor Electrodes in Electrolyte Solutions (pages 253–265): K. Uosaki and M. KoinumaChapter 21 In?situ STM and electrochemical UHV technique: Complementary, Noncompeting Techniques (pages 266–276): M. P. Soriaga, K. Itaya and J. L. StickneyChapter 22 Growth morphology and molecular orientation of additives in electrocrystallization studied by surface?enhanced Raman spectroscopy (pages 277–289): B. Reents and W. PliethChapter 23 Instrumental Design and Prospects for NMR?Electrochemistry (pages 291–302): James B. Day, Jianjun Wu, Eric Oldfield and Andrzej Wieckowski