VLSI اصول تست و معماری : طراحی برای آزمون پذیری VLSI Test Principles and Architectures: Design for Testability
- نوع فایل : کتاب
- زبان : انگلیسی
- نویسنده : Laung-Terng Wang ,Cheng-Wen Wu ,Xiaoqing Wen
- ناشر : Morgan Kaufmann
- چاپ و سال / کشور: 2006
- شابک / ISBN : 9780123705976, 0123705975
Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
